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Wafer Probing

Package Testing

Customized Test Solution

Giga Solution improves the ATE test coverage in challenging test items like IP2/3, Noise figure, Phase noise and high RF power/frequency testing by in-house tester called I2C.

Three different I2C models :

I2C SW

I2C FEM

I2C mmWave

Wafer Probing

An increase in the IC with higher complexity and speed, particularly in wireless, makes the lower yields and the higher package costs...

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Package Testing

Giga Solution offers completed RF test services ranging from test program development and test structure...

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Customized Test Solution

The rapid development in wireless communication chip design has extended the challenges...
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