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| Testing Capability |
| GS provides the test development turn key service to customers. We have the capability to develop test solution for mmWave/Handset/Bluetooth/WLAN TRx and RFSOC, TV Tuner, PA, PA module, Switch, Antenna tuner, TIA, LD and so on using ATE or bench integrated test system called I2C ( Innovated & Integrated customized ) tester. GS also provides loadboard, dut board, probe card, text fixture and handler changeover kits design and manufacture service. |
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| Quick View for GS Testing Engineering / Production Capability: |
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- NPI (new product introduction) service for test development and pre-production test.
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- Test solution optimization through test time reduction and yield improvement
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- Singulated wafer testing.
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- On wafer SOLT calibration.
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- On-Package EMI shielding device test.
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- Ultra small and ultra thin device test.
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- On-line real time yield monitoring system.
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- Backend logistics management
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Wafer Probing
An increase in the IC with higher complexity and speed, particularly in wireless, makes the lower yields and the higher package costs...
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Package Testing
Giga Solution offers completed RF test services ranging from test program development and test structure...
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Customized Test Solution
The rapid development in wireless communication chip design has extended the challenges...
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