|
| Test Equipment |
| ‧Tester Capability |
| ATE Model |
RF Ports |
Frequency | |
| Agilent 84000 A120t |
12 |
6 GHz |
| Agilent 84000 A120t |
12 |
3 GHz |
| Agilent 84000 A50t/A60t |
04 |
3 GHz |
| Agilent 84000 A20 |
02 |
3 GHz |
| Credence ASL3000 |
08 |
6 GHz |
| Teradyne iFLEX RF |
11 |
6 GHz |
| I2C Integrated ATE |
Customized |
18 GHz / 3 GHz |
|
| |
| ‧Handler Capability |
| Handler Model |
Available Change Kit | |
| Epson NS5000 (Pick & Place) |
QFN 4*4 / 5*5 / 7*7 / 12*12 TQFP 7*7 | |
| Epson NS6040 /NS8020(Pick & Place) |
QFN 4*4 / 5*5 /6*6/ 7*7 / 12*12 TQFP 7*7 | |
| Delta 1688 (Pick & Place) |
QFP 10*10 QFN 5*5 / 6*8 LQFP 7*7 | |
| Hitachi SMASH (Pick & Place) |
QFN 7*7 / 5*5 LQFP 7*7 LGA 7*8 / 7*5.5 | |
| Aetrium 5800 (Bowl Feeder) |
QFN 3*2 / 3*3 / 4*4 LGA 7*8 / 7*5.5 SOT 363 | |
| Tripod TT9100 (Bowl Feeder) |
QFN 3*1.6 / 3*2*0.75 / 3*3/4*4/2.5*3.5*0.5/2*2*0.5 SOT 89 | |
| SRM (Bowl Feeder) |
QFN 3*3 / 4*4/7*8/5*5/3*1.6.4.5*4.5
/4*4.5/3.5*3.5*0.5/6*6/3*5 | |
| |
| ‧Auto Prober Capability |
|
|
| Semics Prober |
5'', 6'', 8", 12“ | |
| EG 4090u Prober |
4", 5", 6", 8" | |
| EG 4/200e Prober |
4", 5", 6", 8" | | |
|
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Wafer Test
An increase in the IC with higher complexity and speed, particularly in wireless, makes the lower yields and the higher package costs...
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Package Test
Giga Solution offers completed RF test services ranging from test program development and test structure...
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Custom Test Solution
The rapid development in wireless communication chip design has extended the challenges...
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