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全智封裝級IC測試服務 :
‧Prototype Characterization
‧Functional Test & Bench
‧Test Program Development and Conversion
‧DUT Board Design and Correlation
‧Fixture Design and Correlation
‧Lead Scanning & Rework
‧Baking
‧Drop Shipment |
提供客戶之服務 :
‧WIP Report
‧Yield Analysis
‧Cycle Time Report
‧Periodically Test data Transfer
‧Test Time Optimization | |
